Iris Publishers - Modern Concepts in Material Science (MCMS)


Precision Ellipsometry for Quantitative Real-Time Monitoring of Molecular Layers


Precision ellipsometry (PREL) is optical technique that uses polarization modulator to measure changes in the state of light polarization reflected off a surface of a material. Based on new modulation concept, a polarization modulator was made, which is compact, non-magnetic, consuming low power. With this modulator, a portable PREL system was made and was shown to have sensitivity at molecular level via experiments on attachment of various molecules on silicon surface from air and from water. Real-time measurements of kinetics of molecular binding gave insights into mechanisms of the binding and gave directions to improvement of technology of fabrication of respective materials.



For More Open Access Journals in Iris Publishers Please click on:
https://irispublishers.com/


Comments

Popular posts from this blog

Effect of Infrared Radiation on the Hydrogen in Thin Films Double Barriers Based Melt Silicone-Germany

Iris Publishers - Modern Concepts in Material Science (MCMS)